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Toward robust and high-throughput detection of seed defects in X-ray images via deep learning

Published Online: 2024-05-06

Authors

Hamdy, Sherif

Charrier, Aurélie

Corre, Laurence Le

Rasti, Pejman

Rousseau, David
License Information

Text and Data Mining valid from 2024-05-06

Version of Record valid from 2024-05-06
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Article History

Received: 11 December 2023

Accepted: 26 April 2024

First Online: 6 May 2024

Declarations

:

: The authors declare that they have no Competing interest.

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