The MEAM parameter calibration tool: an explicit methodology for hierarchical bridging between ab initio and atomistic scales
Crossref DOI link: https://doi.org/10.1186/s40192-016-0051-6
Published Online: 2016-05-06
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Barrett, Christopher D.
Carino, Ricolindo L.
Funding for this research was provided by:
Engineer Research and Development Center (W912HZ-15-2-0004)
Text and Data Mining valid from 2016-05-06
Version of Record valid from 2016-05-06
Article History
Received: 26 December 2015
Accepted: 28 March 2016
First Online: 6 May 2016