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Integrated X-ray fluorescence and diffuse visible-to-near-infrared reflectance scanner for standoff elemental and molecular spectroscopic imaging of paints and works on paper

Crossref DOI link: https://doi.org/10.1186/s40494-018-0197-y

Published Online: 2018-05-30

Published Print: 2018-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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