Nanoscale investigation of surface potential distribution of Cu2ZnSn(S,Se)4 thin films grown with additional NaF layers
Crossref DOI link: https://doi.org/10.1186/s40580-014-0027-1
Published Online: 2014-10-08
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Gee Yeong
Kim, Juran
Jo, William
Son, Dae-Ho
Kim, Dae-Hwan
Kang, Jin-Kyu
License valid from 2014-10-08
Article History
Received: 12 August 2014
Accepted: 20 August 2014
First Online: 8 October 2014