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Authors
Jadav, Vipashyana
Feldman, Deborah
Lee, Karen M.
Friedman, Barak
Subramaniam, Raja
O’Donnell, Thomas
Wilck, Eric
Rofsky, Neil M.
Taouli, Bachir
Lewis, Sara https://orcid.org/0000-0002-4713-6453
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Article History
Received: 24 April 2026
Accepted: 3 August 2026
First Online: 19 August 2026
Declarations
Ethics approval and consent to participate: Not applicable.
Consent for publication: Not applicable.
Competing interests: T.O. is an employee of Siemens Healthineers, which manufactures the NAEOTOM Alpha CT scanner that we discuss in this review.
