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High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose

Crossref DOI link: https://doi.org/10.1186/s40679-015-0003-9

Published Online: 2015-03-25

Published Print: 2015-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Yankovich, Andrew B

Berkels, Benjamin

Dahmen, Wolfgang

Binev, Peter

Voyles, Paul M
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Article History

Received: 21 October 2014

Accepted: 27 January 2015

First Online: 25 March 2015