Applying microscopic analytic techniques for failure analysis in electronic assemblies
Crossref DOI link: https://doi.org/10.1186/s42649-019-0009-1
Published Online: 2019-08-13
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Grosshardt, Otto https://orcid.org/0000-0001-9713-2672
Nagy, Boldizsár Árpád
Laetsch, Anette
Text and Data Mining valid from 2019-08-13
Version of Record valid from 2019-08-13
Article History
Received: 16 April 2019
Accepted: 12 July 2019
First Online: 13 August 2019
Competing interests
: The authors declare that they have no competing interests.