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Electron diffraction and dark-field TEM for structural analysis of 2D van der Waals materials

Published Online: 2025-11-11

Authors

Kim, Byunghyun

Park, Daesung

Jeong, Siwon

Yoo, Hyobin https://orcid.org/0000-0002-8039-9482
Funding

Funding for this research was provided by:

National Research Foundation of Korea (RS-2021-NR061606, RS-2021-NR060087)
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Text and Data Mining valid from 2025-11-11

Version of Record valid from 2025-11-11
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Article History

Received: 1 September 2025

Accepted: 23 October 2025

First Online: 11 November 2025

Declarations

:

: The authors declare no competing interests.

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