Self-compliance RRAM characteristics using a novel W/TaO x /TiN structure
Crossref DOI link: https://doi.org/10.1186/1556-276X-9-292
Published Online: 2014-06-10
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Maikap, Siddheswar
Jana, Debanjan
Dutta, Mrinmoy
Prakash, Amit
Text and Data Mining valid from 2014-06-10
Article History
Received: 1 March 2014
Accepted: 15 May 2014
First Online: 10 June 2014