The interfaces of lanthanum oxide-based subnanometer EOT gate dielectrics
Crossref DOI link: https://doi.org/10.1186/1556-276X-9-472
Published Online: 2014-09-05
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wong, Hei
Zhou, Jian
Zhang, Jieqiong
Jin, Hao
Kakushima, Kuniyuki
Iwai, Hiroshi
Text and Data Mining valid from 2014-09-05
Article History
Received: 6 July 2014
Accepted: 15 August 2014
First Online: 5 September 2014