Gate leakage current induced trapping in AlGaN/GaN Schottky-gate HFETs and MISHFETs
Crossref DOI link: https://doi.org/10.1186/1556-276X-9-474
Published Online: 2014-09-08
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liao, Wen-Chia
Chen, Yan-Lun
Chen, Zheng-Xing
Chyi, Jen-Inn
Hsin, Yue-Ming
Article History
Received: 30 June 2014
Accepted: 26 August 2014
First Online: 8 September 2014