Coexistence of memory resistance and memory capacitance in TiO2 solid-state devices
Crossref DOI link: https://doi.org/10.1186/1556-276X-9-552
Published Online: 2014-10-04
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Salaoru, Iulia
Li, Qingjiang
Khiat, Ali
Prodromakis, Themistoklis
Article History
Received: 21 July 2014
Accepted: 23 September 2014
First Online: 4 October 2014