Characterization and density control of GaN nanodots on Si (111) by droplet epitaxy using plasma-assisted molecular beam epitaxy
Crossref DOI link: https://doi.org/10.1186/1556-276X-9-682
Published Online: 2014-12-17
Published Print: 2014-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yu, Ing-Song
Chang, Chun-Pu
Yang, Chung-Pei
Lin, Chun-Ting
Ma, Yuan-Ron
Chen, Chun-Chi
Text and Data Mining valid from 2014-12-01
Article History
Received: 2 October 2014
Accepted: 12 December 2014
First Online: 17 December 2014