Influence of post-annealing on the off current of MoS2 field-effect transistors
Crossref DOI link: https://doi.org/10.1186/s11671-015-0773-y
Published Online: 2015-02-11
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Namgung, Seok Daniel
Yang, Suk
Park, Kyung
Cho, Ah-Jin
Kim, Hojoong
Kwon, Jang-Yeon
License valid from 2015-02-11
Article History
Received: 6 October 2014
Accepted: 20 January 2015
First Online: 11 February 2015