Resistive and New Optical Switching Memory Characteristics Using Thermally Grown Ge0.2Se0.8 Film in Cu/GeSex/W Structure
Crossref DOI link: https://doi.org/10.1186/s11671-015-1090-1
Published Online: 2015-10-07
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jana, Debanjan
Chakrabarti, Somsubhra
Rahaman, Sheikh Ziaur
Maikap, Siddheswar
License valid from 2015-10-07