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Phase-Change Memory Properties of Electrodeposited Ge-Sb-Te Thin Film

Crossref DOI link: https://doi.org/10.1186/s11671-015-1136-4

Published Online: 2015-11-02

Published Print: 2015-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Huang, Ruomeng

Kissling, Gabriela P.

Jolleys, Andrew

Bartlett, Philip N.

Hector, Andrew L.

Levason, William

Reid, Gillian

De Groot, C. H. ‘Kees’
Funding

Funding for this research was provided by:

Engineering and Physical Sciences Research Council (GB) (EP/I010890/1)

Engineering and Physical Sciences Research Council (GB) (Doctoral Prize)
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