Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination
Crossref DOI link: https://doi.org/10.1186/s11671-016-1268-1
Published Online: 2016-02-01
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Narchi, Paul
Alvarez, Jose
Chrétien, Pascal
Picardi, Gennaro
Cariou, Romain
Foldyna, Martin
Prod’homme, Patricia
Kleider, Jean-Paul
i Cabarrocas, Pere Roca
License valid from 2016-02-01