X-ray Reciprocal Space Mapping of Graded Al x Ga1 − x N Films and Nanowires
Crossref DOI link: https://doi.org/10.1186/s11671-016-1299-7
Published Online: 2016-02-09
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Stanchu, Hryhorii V.
Kuchuk, Andrian V.
Kladko, Vasyl P.
Ware, Morgan E.
Mazur, Yuriy I.
Zytkiewicz, Zbigniew R.
Belyaev, Alexander E.
Salamo, Gregory J.
License valid from 2016-02-09