Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger Microscopy
Crossref DOI link: https://doi.org/10.1186/s11671-016-1308-x
Published Online: 2016-02-24
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ponomaryov, Semyon S.
Yukhymchuk, Volodymyr O.
Lytvyn, Peter M.
Valakh, Mykhailo Ya
License valid from 2016-02-24