3D finite element modeling and simulation of industrial semiconductor devices including impact ionization
Crossref DOI link: https://doi.org/10.1186/s13362-015-0015-z
Published Online: 2015-03-14
Published Print: 2015-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mauri, Aurelio
Bortolossi, Andrea
Novielli, Giovanni
Sacco, Riccardo
License valid from 2015-03-14