MEMS-based Ni–B probe with enhanced mechanical properties for fine pitch testing
Crossref DOI link: https://doi.org/10.1186/s40486-016-0039-1
Published Online: 2017-01-07
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Kyongtae
Kwon, Hong-Beom
Ahn, Hye-Rin
Kim, Yong-Jun
License valid from 2017-01-07