Accurate extraction of WSe2 FETs parameters by using pulsed I-V method at various temperatures
Crossref DOI link: https://doi.org/10.1186/s40580-016-0091-9
Published Online: 2016-11-21
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Sung Tae
Cho, In Tak
Kang, Won Mook
Park, Byung Gook
Lee, Jong-Ho
License valid from 2016-11-21