Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images
Crossref DOI link:
Update policy: https://doi.org/10.1007/SPRINGER_CROSSMARK_POLICY
Bouwer, James C.
Deerinck, Thomas J.
Peltier, Steven T.
Ellisman, Mark H.
Funding for this research was provided by:
National Institute of General Medical Sciences (P41GM103412)
Text and Data Mining valid from 2016-09-15
Version of Record valid from 2016-09-15
20 July 2016
9 September 2016
15 September 2016