Sub-Ã…ngstrom electric field measurements on a universal detector in a scanning transmission electron microscope
Crossref DOI link: https://doi.org/10.1186/s40679-018-0059-4
Published Online: 2018-08-24
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hachtel, Jordan A. http://orcid.org/0000-0002-9728-0920
Idrobo, Juan Carlos
Chi, Miaofang
Text and Data Mining valid from 2018-08-24
Version of Record valid from 2018-08-24
Article History
Received: 11 June 2018
Accepted: 9 August 2018
First Online: 24 August 2018