Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope
Crossref DOI link: https://doi.org/10.1186/s40679-019-0065-1
Published Online: 2019-03-09
Published Print: 2019-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sun, Cheng http://orcid.org/0000-0001-9540-1509
Müller, Erich
Meffert, Matthias
Gerthsen, Dagmar
Funding for this research was provided by:
Deutsche Forschungsgemeinschaft (GE 841/20-2)
Text and Data Mining valid from 2019-03-09
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Article History
Received: 3 December 2018
Accepted: 2 March 2019
First Online: 9 March 2019