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Comparative study on the specimen thickness measurement using EELS and CBED methods

Crossref DOI link: https://doi.org/10.1186/s42649-020-00029-4

Published Online: 2020-05-12

Published Print: 2020-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Heo, Yoon-Uk http://orcid.org/0000-0003-4733-9370
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Text and Data Mining valid from 2020-05-12

Version of Record valid from 2020-05-12
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Article History

Received: 17 March 2020

Accepted: 29 April 2020

First Online: 12 May 2020

Competing interests

: The authors declare that they have no competing interests.