A semi-empirical model of the drain/source resistance for MOSFET
Crossref DOI link: https://doi.org/10.1360/N112016-00257
Published Online: 2017-07-14
Published Print: 2017-12-01
Update policy: https://doi.org/10.1360/scp-crossmark-policy-page
WU, Di
YANG, Fei
KE, Daoming
PENG, Xueyang
CHANG, Hong
YANG, Jianguo
HU, Pengfei
SUN, Leshang