Qualification according to AEC-Q semiconductors are sometimes tested insufficiently
Crossref DOI link: https://doi.org/10.1365/s38314-014-0263-5
Published Online: 2014-08-12
Published Print: 2014-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Köhnen, Axel
License valid from 2014-08-01