Performance and Reliability of SiC Power MOSFETs
Crossref DOI link: https://doi.org/10.1557/adv.2015.57
Published Online: 2016-01-07
Published Print: 2016-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lichtenwalner, Daniel J.
Hull, Brett
Pala, Vipindas
Van Brunt, Edward
Ryu, Sei-Hyung
Sumakeris, Joe J.
O’Loughlin, Michael J.
Burk, Albert A.
Allen, Scott T.
Palmour, John W.
Text and Data Mining valid from 2016-01-01
Version of Record valid from 2016-01-01
Article History
First Online: 7 January 2016