FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films
Crossref DOI link: https://doi.org/10.1557/adv.2016.427
Published Online: 2016-06-13
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Talukder, Md Abdul Ahad
Cui, Yubo
Compton, Maclyn
Geerts, Wilhelmus
Scolfaro, Luisa
Zollner, Stefan
Funding for this research was provided by:
U.S. Army (W911NF-15-1-0394)
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Article History
First Online: 13 June 2016