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Simulation Study on Reproducing Resistive Switching Effect by Soret and Fick Diffusion in Resistive Random Access Memory

Crossref DOI link: https://doi.org/10.1557/adv.2016.449

Published Online: 2016-06-13

Published Print: 2016-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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