Current Status of the Quality of 4H-SiC Substrates and Epilayers for Power Device Applications
Crossref DOI link: https://doi.org/10.1557/adv.2016.63
Published Online: 2016-01-26
Published Print: 2016-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dudley, M.
Wang, H.
Guo, Jianqiu
Yang, Yu
Raghothamachar, Balaji
Zhang, J.
Thomas, B.
Chung, G.
Sanchez, E. K.
Hansen, D.
Mueller, S. G.
Text and Data Mining valid from 2016-01-01
Version of Record valid from 2016-01-01
Article History
First Online: 26 January 2016