Enhanced Reliability of Top-pinned Perpendicular Magnetic Tunnel Junction by Post-oxidation of Sputtered MgO Barrier
Crossref DOI link: https://doi.org/10.1557/adv.2017.118
Published Online: 2017-01-30
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yoshida, Chikako
Noshiro, Hideyuki
Yamazaki, Yuichi
Sugii, Toshihiro
Text and Data Mining valid from 2017-01-01
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Article History
First Online: 30 January 2017