In-situ High Temperature X-ray Diffraction Study of the Am-O System
Crossref DOI link: https://doi.org/10.1557/adv.2017.200
Published Online: 2017-02-16
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Epifano, E.
Belin, R. C.
Richaud, J C
Vauchy, R.
Strach, M.
Lebreton, F.
Delahaye, T.
Guéneau, C.
Martin, P. M.
Text and Data Mining valid from 2016-12-01
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First Online: 16 February 2017