Direct Fractographic Evaluation of Multilayer CNx/TiN Films by Magnetron Sputtering
Crossref DOI link: https://doi.org/10.1557/adv.2017.630
Published Online: 2018-01-02
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Song, Gongsheng
Fu, Qiang
Pan, Chunxu
Text and Data Mining valid from 2018-01-02
Version of Record valid from 2018-01-02
Article History
First Online: 2 January 2018