Characterization of Graphene Gate Electrodes for Metal-Oxide-Semiconductor Devices
Crossref DOI link: https://doi.org/10.1557/adv.2017.65
Published Online: 2017-01-19
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
An, Yanbin
Shekhawat, Aniruddh
Behnam, Ashkan
Pop, Eric
Ural, Ant
Text and Data Mining valid from 2017-01-01
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Article History
First Online: 19 January 2017