High Quality Oxide Films Deposited at Room Temperature by Ion Beam Sputtering
Crossref DOI link: https://doi.org/10.1557/adv.2018.157
Published Online: 2018-02-05
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Henein, Gerard E.
Topolancik, Juraj
Siebein, Kerry
Text and Data Mining valid from 2018-01-01
Version of Record valid from 2018-01-01
Article History
First Online: 5 February 2018