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Variations in Electric Switching and Transverse Resistance of GeTe/ Sb2Te3 Superlattices at Elevated Temperature Studied by Conductive Scanning Probe Microscopy

Crossref DOI link: https://doi.org/10.1557/adv.2018.241

Published Online: 2018-03-01

Published Print: 2018-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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