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Dependence of structural and optoelectronic properties on thickness of γ-cui thin films deposited by vacuum thermal evaporation

Crossref DOI link: https://doi.org/10.1557/adv.2018.317

Published Online: 2018-03-28

Published Print: 2018-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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