Atomistic simulation of nearly defect-free models of amorphous silicon: An information-based approach
Crossref DOI link: https://doi.org/10.1557/adv.2019.76
Published Online: 2019-01-31
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Limbu, Dil K.
Atta-Fynn, Raymond
Biswas, Parthapratim
Text and Data Mining valid from 2019-01-01
Version of Record valid from 2019-01-01
Article History
First Online: 31 January 2019