IR hot carrier based photodetection in titanium nitride oxide thin film-Si junctions
Crossref DOI link: https://doi.org/10.1557/adv.2020.129
Published Online: 2020-09-27
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Güsken, Nicholas A.
Lauri, Alberto
Li, Yi
Jacassi, Andrea
Matsui, Takayuki
Doiron, Brock
Bower, Ryan
Regoutz, Anna
Mihai, Andrei
Petrov, Peter K.
Oulton, Rupert F.
Cohen, Lesley F.
Maier, Stefan A.
Text and Data Mining valid from 2020-07-01
Version of Record valid from 2020-07-01
Article History
First Online: 27 September 2020