Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy
Crossref DOI link: https://doi.org/10.1557/jmr.2016.297
Published Online: 2016-08-30
Published Print: 2017-03-14
Update policy: https://doi.org/10.1017/policypage
Smith, David J.
Lu, Jing
Aoki, Toshihiro
McCartney, Martha R.
Zhang, Yong-Hang
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License: Copyright © Materials Research Society 2016