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Platform for in-plane<i>ZT</i>measurement and Hall coefficient determination of thin films in a temperature range from 120 K up to 450 K

Crossref DOI link: https://doi.org/10.1557/jmr.2016.353

Published Online: 2016-10-27

Published Print: 2016-10-28

Update policy: https://doi.org/10.1017/policypage

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