Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination
Crossref DOI link: https://doi.org/10.1557/jmr.2016.443
Published Online: 2016-12-13
Published Print: 2017-03-14
Update policy: https://doi.org/10.1017/policypage
Roshko, Alexana
Brubaker, Matt D.
Blanchard, Paul T.
Bertness, Kris A.
Harvey, Todd E.
Geiss, Roy H.
Levin, Igor
License valid from 2016-12-13
Copyright and Licensing
License: Copyright © Materials Research Society 2016