Lifetime limitations in organic electronic devices due to metal electrochemical migration
Crossref DOI link: https://doi.org/10.1557/mrc.2017.46
Published Online: 2017-07-19
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Abbel, Robert
van de Peppel, Linda
Kirchner, Gerwin
Michels, Jasper J.
Groen, Pim
Funding for this research was provided by:
Seventh Framework Programme (31011)
Text and Data Mining valid from 2017-07-19
Version of Record valid from 2017-07-19
Article History
Received: 6 April 2017
Accepted: 16 June 2017
First Online: 19 July 2017