The effect of substrate roughness on the properties of RF sputtered AZO thin film
Crossref DOI link: https://doi.org/10.1557/mrc.2019.66
Published Online: 2019-06-20
Published Print: 2019-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hamada, Kairi
Ogawa, Takaya
Okumura, Hideyuki
Ishihara, Keiichi N.
Text and Data Mining valid from 2019-06-01
Version of Record valid from 2019-06-01
Article History
Received: 24 January 2019
Accepted: 14 May 2019
First Online: 20 June 2019