Multiscale 3D characterization with dark-field x-ray microscopy
Crossref DOI link: https://doi.org/10.1557/mrs.2016.114
Published Online: 2016-06-08
Published Print: 2016-06
Update policy: https://doi.org/10.1017/policypage
Simons, Hugh
Jakobsen, Anders Clemen
Ahl, Sonja Rosenlund
Detlefs, Carsten
Poulsen, Henning Friis
License valid from 2016-06-08
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License: Copyright © Materials Research Society 2016