Nanometrology and super-resolution imaging with DNA
Crossref DOI link: https://doi.org/10.1557/mrs.2017.274
Published Online: 2017-12-08
Published Print: 2017-12
Update policy: https://doi.org/10.1017/policypage
Graugnard, Elton
Hughes, William L.
Jungmann, Ralf
Kostiainen, Mauri A.
Linko, Veikko
Copyright and Licensing
License: Copyright © Materials Research Society 2017