Purely electronic nanometallic resistance switching random-access memory
Crossref DOI link: https://doi.org/10.1557/mrs.2018.91
Published Online: 2018-05-10
Published Print: 2018-05
Update policy: https://doi.org/10.1017/policypage
Lu, Yang
Yoon, Jung Ho
Dong, Yanhao
Chen, I.-Wei
License valid from 2018-05-10
Copyright and Licensing
License: Copyright © Materials Research Society 2018