<i>In situ</i> mechanical testing in an SEM performed at 1150°C with submicron resolution
Crossref DOI link: https://doi.org/10.1557/mrs.2020.172
Published Online: 2020-06-16
Published Print: 2020-06
Update policy: https://doi.org/10.1017/policypage
Le Ferrand, Hortense
License valid from 2020-06-16
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